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All-in-One Report Demo (NSN: 6625011488833, Part Number: CASE7TSM131A)
Master Cross Reference Data (MCRD) - alternate part numbers for national stock numbers
NSN
Description
MCRL Information
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6625011488833
TEST SET SUBASSEMBLY,ELECTRICAL
INC: 42648
HMIC: P
ESDC: A
ENAC:
Cancelled By: |
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DRMS - Government Auction History - (NSN : 6625011488833)
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Description
Event #
Lot #
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Location |
Total Bid |
QTY
#Items in Lot
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Condition
Acquisition
Price
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Lot Title
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TEST SET SUBASSEMBL
Event: 856
Lot: 184
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Norfolk VA |
Details Available
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Qty: 1
Items: 4
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H7
Details Available
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LOT (4) TEST SET SUB-ASSEMBLIES TO INCLUDE:(1) VSI MDL:2575 AC/DC ACTIVE CURRENT SHUNT (1) ESI MDL:874 COMPENSATOR (1) KH MDL:6500 PHASE METER (1) GA MDL:1311-A AUDIO OSCILLATOR`ESI MDL:DB62 DECADE RESISTER, 2-TEK MDL:7B53A DUAL TIME BASE PLUG-INS, 1-HP MDL:432A POWER METER
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TEST SET SUBASSEMBL
Event: 1056
Lot: 186
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Norfolk VA |
Details Available
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Qty: 1
Items: 1
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A1
Details Available
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TEST SET SUBASSEMBLY TO INCLUDE:VALHALLA SCIENTIFIC MDL:2575A, AC-DC WIDEBAND ACTIVE CURRENT SHUNT, DEKACLE MDL:DB62, DECADE RESISTOR, FLUKE MDL:887AA, VOLTMETER
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TEST SET SUBASSEMBL
Event: 1056
Lot: 187
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Norfolk VA |
Details Available
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Qty: 1
Items: 1
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A1
Details Available
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TEST SET SUBASSEMBLY TO INCLUDE:VALHALLA SCIENTIFIC MDL:2575A, AC-DC WIDEBAND ACTIVE CURRENT SHUNT, DEKACLE MDL:DB62, DECADE RESISTOR, FLUKE MDL:887AA, VOLTMETER
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TEST SET SUBASSEMBL
Event: 1349
Lot: 274
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Norfolk VA |
Details Available
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Qty: 1
Items: 3
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A1
Details Available
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LOT (4) TEST SET SUBASSEMBLIES ON 3PLTS
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Technical Characteristics - detailed information such as measurements and material type for national stock numbers
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NSN
Item Name |
Technical Characteristics |
6625-011488833
TEST SET SUBASSEMBLY,ELECTRICAL |
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Management Data - US Gov't supply management data (costs, storage, etc.)
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NSN
Item Name |
Management Data |
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6625-011488833
TEST SET SUBASSEMBLY,ELECTRICAL
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| PMIC |
Criticality |
ADPE |
ESDC |
HMIC |
DEML |
| A |
X |
0 |
A |
P |
B |
| S / A |
SOS |
AAC |
QUP |
UI |
Unit
Price |
SLC |
CIIC |
Rep
Code |
Mgmt
Ctrl |
Phrase
Data |
| Details Available
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