Description
Event #
Lot #
|
Location |
Total Bid |
QTY
#Items in Lot
|
Condition
Acquisition
Price
|
Lot Title
|
 |
DISPLAY ASSEMBLYAN
Event: 973
Lot: 216
|
Norfolk VA |
Details Available
|
Qty: 5
Items: 11
|
F7
Details Available
|
LOT (18) TEST EQUIP TO INCUDE:POWER DISPLAY ANALYZERS, AYON MONITOR SYSTEM, TRANSMISSON TEST SET, SENCORE MDL:SC61 TEST SET, ESI SUB ASSEMBLY TEST SET, HP MDL:5065A STANDARD FREQUENCY (5 PLTS)
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 67
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
B4
Details Available
|
AIL SYSTEMS INC ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 65
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
B4
Details Available
|
AIL SYSTEMS INC ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 66
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
B4
Details Available
|
AIL SYSTEMS INC ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 54
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 51
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC DBA EDO ELECTRONIC SYSTEMS GROUP ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 52
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC DBA EDO ELECTRONIC SYSTEMS GROUP ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 53
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC DBA EDO ELECTRONIC SYSTEMS GROUP ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 55
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC DBA EDO ELECTRONIC SYSTEMS GROUP ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 56
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC DBA EDO ELECTRONIC SYSTEMS GROUP ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 57
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
A1
Details Available
|
AIL SYSTEMS INC DBA EDO ELECTRONIC SYSTEMS GROUP ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 63
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
B4
Details Available
|
AIL SYSTEMS INC ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3181
Lot: 64
|
Columbus OH |
Details Available
|
Qty: 1
Items: 1
|
B4
Details Available
|
AIL SYSTEMS INC ANALYZER DISPLAY ASSEMBLY P/ N: BEN230472
|
|
|
DISPLAY ASSEMBLYAN
Event: 3699
Lot: 515
|
Redstone Arsenal AL |
Details Available
|
Qty: 2
Items: 16
|
A1
Details Available
|
LOT (3 PLTS)ELECTRONICS INCLUDES: TTC, MDL: 10600, TEST COMPUTER W/ MANUALS, TETRONIX, MDL: 7612D, WAVE FORM, FLUKE, MDL: 742A1, RESISTANCE STANDARD & HEWLETT PACKARD, MDL: 3497A, TEST CONTRLLER
|
|
|
DISPLAY ASSEMBLYAN
Event: 3719
Lot: 10
|
Columbus OH |
Details Available
|
Qty: 3
Items: 19
|
B4
Details Available
|
LOT (36) ON (9) PLTS ELECTRICAL SUBASSEMBLY TEST SET, TEST FIXTURE, ANALYZER DISPLAY ANALYZER, MULTIPLEXER SET, UNIVERSAL COUNTER, COORDINATE RECORDER, TELEGRAPH TEST SET, STANDING WAVE METER, DECADE CAPACITOR, ANALYZER SPECTRUM, MULTIPLEXER SET AND GENERATOR ANALYZER (BLDG 9)
|
|
|
DISPLAY ASSEMBLYAN
Event: 3719
Lot: 11
|
Columbus OH |
Details Available
|
Qty: 2
Items: 18
|
B4
Details Available
|
LOT (35) ON (8) PLTS ELECTRONIC COMPONENTS INCLUDE: HP 7402A-168 PORTABLE OSCILLOGRAPH, DC AMMETER, FLUKE CORPORATION AND BOONE ELECTRONICS VOLTMETERS, AGILENT TECHNOLOGIES SIGNAL GENERATOR AND GENRAD INC RESISTANCE BRIDGE, NORTHROP GRUMMAN CORP MDL: 206 61200-608A ELECTRONIC SYSTEMS TEST SET WHICH TESTS DIGITAL MONITORS, FLUKE CORP MDL 895A VOLTMETERS 50 HERTZ, 1 KILOHERTZ, 1 PHASE. ELECTRONIC COMPONETS INCLUDE AMMETERS RADIO TEST SETS AND RF PROBE, MULTIMETER, OSCILLOSCOPE SIGNAL GENERATOR, MULTIMETER, ELECTRONIC COUNTER, ANALYZER SPECTRUM AND SWEEP GENERATOR
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